Combining atomic force microscopy and shear-force acoustic near-field microscopy to characterize confined mesoscopic fluids
نویسندگان
چکیده
منابع مشابه
Acoustic microscopy by atomic force microscopy
We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife-edge detector. Acoustic images taken on the ...
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Abbreviations a 1 , a 2 , a 3 , a 4 and A 1 , A 2 , A 3 , A 4 Constants in the shape function y(x) a C Contact radius α Wave number of the flexural waves A Cross-section area of the cantilever b Thickness of the cantilever c P Ratio φ Lat /φ d Y 0 , d X0 Normalized amplitude of the sensor tip in y-and x-direction, respectively δ n , δ L Normal, lateral contact deflection (in the coordinate syst...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2018
ISSN: 1742-6588,1742-6596
DOI: 10.1088/1742-6596/1143/1/012015